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Nova NovaScan 420 Spectrophotometer ITM System This NovaScan 420 Integrated Thickness Monitoring (ITM) system is used, operable surplus. The system powers on with no trouble. This ITM system is ready to produce fast and accurate thin-film thickness measurements of patterned product wafers in real time. Its compact design allows for it to be installed onto processing equipment. The physical condition is good with some minor scratches. * Sold with a 90 Day Guarantee SEMICONDUCTOR EQUIPMENT SPARES Monday Friday: 8:30 AM - 5:00 PM Mountain Standard Time (MST) Closed Saturday, Sunday and all major US holidays. SEMICONDUCTOR EQUIPMENT SPARES |
