Kevex omicron xrf spectrometer x-ray machine calibrated

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Subject: Kevex omicron xrf spectrometer x-ray machine calibrated
Kevex Omicron XRF Spectrometer X-Ray Machine CALIBRATED
Kevex Omicron XRF Spectrometer X-Ray Machine CALIBRATED Original price: $90-110k
This Kevex Omicron XRF Spectrometer is used and is offered with a 14-day guarantee of proper operation. It is calibrated and in excellent physical and cosmetic condition.
TURNKEY SOLUTION There is enough equipment here to form a fully operational system.
Spectrum This was collected on 10/31/06 off this maching using a 316 stainless steel standard
XRF table and computer table are not included
* This instrument has passed a 316 (stainless steel) alloy calibration including shaping indexes of 16, 32, and 64 at gain=40 within 4 iterations each.
* Tube stability: RSD=0.22% in 1,616,029 counts (target value - 0.25% in 1,000,000 counts; typical value 0.08-0.14%RSD) after a 48 hour warmup.
* The resolution and stability figures indicate the detector should be replaced in order for the system to meet its published specs. It is useful as it is for applications where quantification is not critical, such as for sorting alloys.
* The stage operates properly in x, y, and z.
Distinguishing features: This is the only XRF machine ever made that combines a small x-ray beam diameter (100um), a large (8"x8") fully moveable stage, and a video camera.
Power requirement: 115VAC, 15A
This system requires about 8L of liquid nitrogen per week.
* Options: 100W X-ray tube instead of the more common 50W tube, stage has Z-travel
* Last calibration: 09-21-05
* Date of manufacture: 1996
* X-ray tube: 100W, 50kV max, 5mA max, Mo target, external water cooling
* Detector: Si(Li), cooled by liquid nitrogen; see also photo below showing tag
* Sample: 200 mm and smaller wafers - other sample trays are available. Z-axis motion is built-in for these other uses.
* Software version: SDP v2.1, WinXRF v2.21
* In atmosphere, silicon and heavier elements are detectable
* With helium purge, carbon and heavier elements are detectable
* Quantitative and qualitative elemental analysis
* Kevex Omicron x-ray machine, warning light, joystick, x-ray enable key, panel wrench, and 10 liter liquid nitrogen dewar.
* Dell PC with printer Hewlett Packard LaserJet 4 Plus(no password required)
* Two monitors and cables as shown. Controller cable included.
* neslab CFT-25 chiller, required for the 100W x-ray tube
* A few (but not all) manuals are included: WinXRF user's guide, Omicron preinstallation manual, product service log (no history inside but the phone number is correct), and portable x-ray source operation manual. The operator's manual is missing.
* The cart holding the computer is not included.
* NO vacuum pump included (this is an option and is not required for operation.)
The Kevex Omicron is a fine XRF machine proved to be very useful but eventually became too costly to manufacture. Production started in 1990 and continued until 2000. It is one of three instruments that still have full support from Kevex (now Thermo Electron.)
X-ray fluorescence is a non-destructive technique that can identify and quantify elemental constituents of solids, liquids, and thin films. XRF is sensitive to elements with atomic numbers from sodium to uranium and concentrations from tens of ppm to 100 wt %. X-rays from an X-ray tube excite atoms in the sample and cause them to emit X-rays with energies characteristic of the atoms. With appropriate reference standards, accurate quantification of the elemental composition of both solid and liquid samples can be performed.
X-rays from a tungsten anode or molybdenum tube impinge the sample surface at a glancing angle, within the critical angle for total external reflectance, and excite the electrons on atoms in the top few monolayers of the sample, causing them to emit photons (fluoresce). The X-ray photons emitted by the surface atoms have energies that are characteristic of the particular element. They are detected by an Si(Li) energy dispersive spectrometer. Quantification is achieved using a sample with a known areal density of impurity atoms (e.g. Ni) on the surface, and corrections with relative sensitivity factors are used for the other elements.
* Surface must be smooth and flat
* Needs at least 30 mm diameter area
* Up to 200 mm diameter wafers
* Excellent detection limits for surface metals (top 18 mm)
* Rapid acquisition capabilities
* Qualitative determination of plated vs. particulate contamination
* Results independent of substrate
Kevex Instruments Inc is a manufacturer of X-ray elemental analyzers, capable of analyzing sample sizes ranging from microns to millimeters, thickness from angstroms to microns, and elemental concentrations from PPM to weight percents. Specializing in the fields of electron-beam microanalysis, bulk and micro-focus XRF, and automated systems for process monitoring and control, Kevex leads the way with patented innovations such as the Quantum atmospheric thin window, the Superdry no-LN detector, and the PXS microfocus x-ray source which opened up the new technology of x-ray microfluorescence (XRMF). Sigma Gold Microanalyzer- Sigma provides a microanalyzer capable of spectral and image quantification, elemental mapping, feature analysis, EM column and stage automation. Omicron Examiner Analyzer- The Micro X-ray fluorescence (MXRF) analyzer. It combines the elemental sensitivity of XRF with spatial resolution in the SEM microanalysis range. Omnicron, a FAB/Lab Microfluorescence System, accommodates solids or liquids, performing spectral analysis or thin film quantification and mapping. Semicron XRF Wafer Thin Film Analyzer- The fully automated small-spot EDXRF spectrometer designed specifically for clean room wafer dielectric and thin metal film metrology. It can nondestructively analyze simultaneously single and multi-layered films for thickness and compsition. The Sentinel is based on the existing Omicron Examiner with additional software and hardware to increase usability, reduce background, improve detection limits (below 1 ppb) and increase sensitivity for trace element process analysis.
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