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Agilent / HP 4156B Semiconductor Parameter Analyzer The Agilent / HP 4156B is the next generation in precision semiconductor parameter analyzers. You get the best digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument. This new family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis. HP 4156B has four highly accurate source/monitor units, two voltage source units, and two voltage measurement units. It is designed for Kelvin connections and has high-resolution SMUs, so it is especially suited for low resistance and low current measurements. * High-resolution/accuracy and wide range. I: 1 * fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V * Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs * Synchronized stress/measure function, two high-voltage pulse generator units (±40 V) * Tme-domain measurement: 60µs–variable intervals, up to 10,001 points * Easy to use: knob-sweep similar to curve tracer, automatic analysis functions * Automation: built-in HP Instrument BASIC, trigger I/O capability * Four HP 04155-61602 Kelvin Triaxial Cables(3m) * One Application Disk, P/N 04155-18003 Rev. A.01.30 * One HP VEE Sample Program Disk, P/N 04155-18401 Rev. A.01.00 * Sample Application Programs Guide Book * HP Instrument BASIC Manuals * Our hours of operation are M-F, 10-5PM Pacific Standard Time. Phone: Fax: |