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Multi-Wavelength Ellipsometer uses light at 3 different wavelengths. Excellent condition - used lightly in a government QC lab. Automatic sample stage accomidates samples or wafers up to 6": movement can be pre-programmed or controlled via joystick . Will automatically measure, display and print 1 or multiple points on a substrate and print measured values, averages, etc. Easily replaced tungsten halogen lamp with interference filter configuration for 633, 576, 405nm measurements. Includes Micro-spot optics to allow measurements in areas smaller than 50um. Digital video and monitor of measurement region. SECSII Interface for computer control. Integrated software makes measuring n, k, and t for single and multilayer films easy. Unit is tested using Rudolph oxide standard and guaranteed operational. 30 day return policy on this item for non-dealers. See our website for T&C (www.optisales.com) |