High throughput is achieved on the MCT 4610 Handlers through short intervals between tests, a lower device jam rate and, in the case of the 4610 DUAL Handler, the utilization of two test sites. Dual test sites allow devices to be tested in parallel or in alternation, which maximizes tester usage by testing one IC device while another IC device is being moved to the test site.
USED, SURPLUS REMOVED FROM SEMIFAB MFG/TEST FACILITY.
SOME SIGNS OF USE BUT LOOKS TO BE IN GOOD-USED SHAPE.
NOT GOING TO PRETEND TO KNOW HOW TO TEST THIS UNIT.
COMES AS PICTURED. PLEASE FEEL FREE TO ASK QUESTIONS.
NOT SURE WHICH PACKAGE IS INSTALLED.
UNIT WILL BE PALLETIZED AND READY FOR DOCK-HIGH PICKUP FROM AREA CODE 75074.
we reserve the right to re-list the item if not paid after 7 days.
IF YOU ARE IN ALASKA OR HAWAII PLEASE BE PREPARED TO PAY A SLIGHTLY
Seller is not responsible for uninsured items.
Texas residents add 8.25% Sales Tax. This Item is represented as accurately as possible.